CURRICULUM VITAE

 

Dr. Bibhudutta Rout

Research Scientist,

Louisiana Accelerator Center, University of Louisiana at Lafayette

320 Cajundome Blvd., Lafayette, Louisiana – 70506

E-mail: bibhu@louisiana.edu,     Tel: 337-482-6184 (office), 337-298-7099, Fax : 337-482-6190.

Employment History

  • Current  Appointment : Research Scientist (Dec. 2003 - till date), Louisiana Accelerator Center, University of Louisiana at Lafayette, USA.
  • Post-doctoral fellow (January 2001- 2003), School of  Physics, University of Melbourne, Australia.
  • Visiting Scientist, (March-June, 1996 & June-August, 1997), Department of Physics, State University of  New York at Albany, Albany, USA.
  • Pre-doctoral Research Fellow (1993-94), Doctoral Research Fellow (1994-98) &  Senior Research Fellow (1998-2000), Institute of  Physics, Bhubaneswar, India.

Educational Qualifications and Awards

  • Doctor of  Philosophy (Physics) (2001), Institute of Physics, Bhubaneswar, India.
  • Masters of  Philosophy (Advanced Physics) (1994), Institute of Physics, Bhubaneswar, India.
  • Masters of Science (Physics) (1992), Utkal University, Bhubaneswar, India.

 

  • Young Scientist Award (1999), Orissa State Science Academy, Orissa, India.

·         Best Poster Presentation Award (1997), Annual Solid State Physics Symposium, Cochin, India  ( sponsored by  Department of Atomic Energy, India ).       

 

Research Expertise

·         Accelerator Physics, Ion beam micro-probe technology and applications, Thin film growth, Ion implantation, Ion beam lithography, Ion beam analysis and Ultra-High Vacuum techniques.

Professional experience and accomplishments

12/ 2003 – Present   Research Scientist at  Louisiana Accelerator Center, University of Louisiana at Lafayette, USA with Prof. Gary A. Glass: 

  • Maskless Micromachining and Micro-analysis of Semiconductors, Biological samples.
  • Development of a HE-FIB system for next-generation Lithography and MEMS applications.
  • Development of an ultra-bright ion source for tandem accelerator.
  • Development of a revolutionary Russian Magnetic Sextuplet (RMS) Nuclear microprobe system.
  • Proposal writing, commercialization, external collaboration and supervising graduate students.

1/2001 – 11/2003       Post-doctoral Research Fellow at School of Physics, University of Melbourne, Australia with Prof. David N. Jamieson:  

  • Program manager, Nuclear microprobe activities: micro-analysis, nano-fabrications.
  • Development of (design, fabrication, testing and installation)  of a new generation HE-FIB systems (Quadrupole magnetic focusing lens, robust scanning and data acquisition systems).
  • Characterization of various doped Superconducting tapes (BISCO/Ag, MgB2/Fe, MgB2/Cu), Si Quantum computer devices, Solar cells.
  • Ultra low dose (107 ions/cm2) irradiation of thin-film resists for nano-fabrications in polymers and high dose (1017 ions/cm2) for fabricating grating structures in optical fibers.
  • Collaboration with British Aerospace Engineering (BAE) and CSIRO on Characterization of Novel, Non Chromate Based Conversion Coatings for Aerospace Aluminium Alloys.
  • Supervising graduate students, collaborations with national and international ion beam groups.  

3-6/ 1996 & 6-8/ 1997  Visiting Scientist at Dept. of Physics, State University of New York at Albany, NY with Prof. H. Bakhru and Mr. A. W. Haberl:

  • Designing, testing of components for fabrication of a HE-FIB system.
  • Analysis of self-assembled metal-Si micro, nano-structures grown on Br-passivated Si surfaces.
  • Handling an INDO-USA international collaboration, sponsored  by Naval Research Laboratory.

7/1994 – 12/2000   Doctoral Scholar at Institute of Physics, Bhubaneswar, India with
Prof. Bhupen N. Dev:

  • Ph.D. thesis work mainly involved the growth of metallic layers (Au, Ag and Pb)  on Si surfaces, growth of thermally or ion-irradiation induced self-assembled structures, epitaxial or otherwise in these systems and characterization using RBS/ Ion channeling, PIXE, AES/LEED, AFM and Optical microscopy.
  • Instrumental in the design, fabrication and installation of many new beamlines (UHV surface Science, HE-FIB and AMS) with a 3MV ion accelerator. This is one of the national facilities with users from various universities and institutions within India.
  • Implantation of As, Au, Sb, Si in Si, GaAs for studies related to the range and lattice locations, damage calculations, improvements of crystallinity as well as surface modifications.
  • Operation, maintenance and training of the users of the ion accelerator facility.     

 

Membership in Professional society:

1. The International Society for Optical Engineering (SPIE).

I have delivered more than 20 talks in conferences/ Symposia.

Publications

I have achieved more than 40 peer-reviewed research publications.

 

1.         Maskless micromachining with high-energy focused ion beams, B. Rout, R. D. Greco, A. D. Dymnikov, J. R. Reinhardt, J. Peeples, M. Kamal, M. Lentz, G. A. Glass, Proc. SPIE 5751,  (2005) 1050-1057 – Emerging Lithographic Technologies IX; R. Scott Mackay; Ed. 

2.         Thin-film resists for registration of single-ion impacts; V. Millar, C.I. Pakes, S. Prawer, B. Rout, and D.N. Jamieson, Nanotechnology 16(6) (2005) 823-826.

3.         The position of a scanner and its influence on the beam spot size in a nuclear microprobe, A. D. Dymnikov, G. A. Glass, B. Rout, Nucl. Inst. And Meth. B. (in press).

4.         Upgradation of a Duoplasmatron ion source to produce high brightness beam for nuclear microprobe applications with a tandem accelerator; B. Rout, R. Greco, N. Pastore, A. D. Dymnikov, G. A. Glass, Nucl. Inst. And Meth. B (in press).

5.         Zoom quadrupole focusing systems producing an image of an object, A. D. Dymnikov, G. A. Glass, B. Rout, Nucl. Inst. And Meth. B (in press).

6.         High energy focused ion beam lithography using P-beam writing; G. A. Glass, B. Rout, A. D. Dymnikov, R. Greco, M. Kamal, J. A. Peeples, J. A. Reinhardt, Nucl. Inst. And Meth. B (in press).

7.         Retrocutting nuclear microprobe quadruple lens profiles to improve field strength; D. N. Jamieson, R. Szymanski, B. Rout and R. Brenn, Nucl. Inst. And Meth. B 231(1-4) (2005) 49-52.

8.         Shape variation in epitaxial microstructures of gold silicide grown on Br-passivated Si(111) surfaces, S. Chakraborty, J. Kamila, B. Rout ,B. Satpati, P.V. Satyam, B. Sundaravel and B. N. Dev, Surf. Science, Vol 549 (2) (2004) 149.

9.         Microstructural Characterisation of RF Magnetron Sputtered ZnO Thin Films on SiC, A. Trinchi, W. Wlodarski, S. Santucci, D. Di Claudio, M. Passacantando, C. Cantalinim B. Rout, S. J Ippolito, K. Kalantar-Zadeh and G. Sberveglieri, Solid State Phenomena Vol. 99-100 (2004) 123.

10.     Phase correlations of elemental maps using nuclear microscopy, B. Rout, D. N. Jamieson, T. Hopf, C. G. Ryan, Nucl. Inst. and Meth.  B 210, 129 ( 2003 ).

11.     The Amsterdam Quintuplet Nuclear Microprobe, M. J. J. Van den Putte, B. Rout, R. Szymanski, D. N. Jamieson, J. F. J. Van den Brand,  Nucl. Inst. and Meth.  B 10, 21 ( 2003 ).

12.     Long period gratings in multimode fiber fabricated with high-energy ion implantation, K. J. Grant, A. Roberts, D. N. Jamieson, C. Cher, B. Rout, Fiber and Integrated Optics, 22 (2003) 225.

13.     Properties of Ga-Zn based mixed oxides for gas sensing applications, A. Trinchi, K. Galatsis, Y.X. Li, W. Wlodarski, S. P. Russo, J. du Plesis and B. Rout , IEEE Journals (in Press).

14.     An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS;  S. K. Toh, D. G. McCulloch, J. du Plessis, P.J.K. Paterson, A. E. Hughes, D. Jamieson, B. Rout, J. M. Long, A. Stonham, Surface Review and Letters", 10(2-3), 365-371 (2003).

15.     Fabrication of  periodic grating structures in Optical fibers, using nuclear microprobe, B. Rout, C. Cher, K. Grant, A. Roberts, D. N. Jamieson ,  Proc. SPIE 4935, 172 (2002) - Smart Structures, Devices, and Systems; Erol C. Harvey, Derek Abbott, Vijay K. Varadan; Eds.

16.     Nuclear microprobe analysis of U-doped (Bi,Pb)2Sr2Ca2Cu3Oy/Ag superconducting tapes   B Rout, J Hendriks, D N Jamieson, R Szymanski, D Milliken and S X Dou, Nucl. Inst. and Meth. B 190, 357 (2002).

17.     Clustering in Pb thin films on Si(111) and Pb-induced Si surface ordering, B. Rout, J. Kamila, M. Runde, B. N. Dev, Nucl. Inst. and Meth. B  190, 641 (2002).

18.     The new Melbourne nuclear microprobe system, D N Jamieson, B Rout, R Szymanski, P Spizzirri, A Sakellariou, W Belcher and C G Ryan,    Nucl. Inst. and Meth. B 190, 54 (2002).

19.     PIXE cluster analysis of ancient ceramics from North Syria, I. E. Kieft, D. N. Jamieson, B. Rout, R. Szymanski, A. S. Jamieson, Nucl. Inst. and Meth. B  190, 492 (2002).

20.     Ion-beam-induced-charge characterization of particle detectors, C. Yang, D. N. Jamieson, S. M. Hearne, C. I. Pakes, B. Rout, E. Gauja, A. J. Dzurak, R.G. Clark, Nucl. Inst. and Meth. B  190,  212 (2002).

21.     Nanoscale fabrication using single-ion  impacts, V. Miller, C. I. Pakes, A. Cimmino, D. Brett, D. N. Jamieson, S. Prawer, C. J. Yang, B. Rout, R. P. McKinnon, A. S. Dzurak, R. G. Clark, Smart Mater. Struct. 11, 686 (2002).

22.     Ion-irradiation-induced mixing, interface broadening and period dilation in Pt/C multilayers, S K Ghose, D K Goswami, B Rout, B N Dev, G Kuri and G Materlik, Appl. Phy. Lett. 79(4), 467 (2001).

23.     Development of an ion micro-beam facility at Institute of Physics, Bhubaneswar, B. Rout, S. K. Ghose, S. Dey, D. P. Mahapatra, B. N. Dev, H. Bakhru, A. W. Haberl, Indian Jour. Of Pure and Appl. Phy. 39(1-2), 62-64 (2001).

24.     Redistribution of Ni implanted into InP, T. K. Chini, S. K. Ghose, B. Rout, B. N. Dev, M. Tanemura, and F. Okuyama, Eur. Phys. J. AP 13, 83 (2001).

25.     Self-assembled gold silicide wires on bromine-passivated Si(110) surfaces, B Rout, B Sundaravel, Amal K Das, S K Ghose, K Sekar, D P Mahapatra and B N Dev,     Jr. of Vacuum Sc. and Tech. B 18(4), 1847 (2000).

26.     Characterization of microstructures formed on MeV ion-irradiated silver films on    Si(111) surfaces, B Rout, J Kamila, S K Ghose, D P Mahapatra and B N Dev, Nucl. Inst. and Meth. B 181, 268 (2001).

27.     Status of ion microbeam facility at the Institute of Physics, Bhubaneswar, India, B Rout, S K Ghose, D P Mahapatra, B N Dev, H Bakhru and A W Haberl,  Nucl. Inst. and Meth. B 181, 110 (2001).

28.     Radiation damage and surface modification of GaAs(001) MeV C+ and C2+ co-implantation  with Ga2+ , S. K. Ghose, G. Kuri, A. K. Das, B. Rout, D. P. Mahapatra, B. N. Dev,  Nucl. Instr. and Meth. B 156, 125-129 (1999).

29.     Improvement of Ag(111) epitaxy on Si(111) by MeV Si+ irradiation and ion micro-beam analysis of thermally induce morphology,  B. Sundaravel, Amal K. Das, S. K. Ghose, B. Rout and B. N. Dev,  Nucl.  Instr.  Math.   B 156, 130-134 (1999).

30.     Micro Ion-beam facility at Institute of Physics, Bhubaneswar,  B. Rout, S. K. Ghose, B. Sundaravel, G. Kuri, D. P. Mahapatra and B. N. Dev, P. Sen, H. Bakhru and A. W. Haberl, Journal of Radiation Physics and Chemistry (RPC),  51(4-6), 677 (1998).  

31.     Range profile and lattice location of MeV implant  in Si (100), S. Dey, G. Kuri, B. Rout, S. Varma, Nucl. Instr. and Meth  B; 142, 35-42 (1998).

32.     High energy Ni Implantation in InP; T. K. Chini, S. R. Bhattacharya, D. Basu, B. Rout, S. Ghose, B. Sundaravel, B. N. Dev, F. Okuyama, M. Kaneko, J. Mater. Sci. Lett.  17, 1117 (1998).

33.     Improved High Energy Microbeam techniques;  A. Kumar, H. Bakhru, A. W. Haberl, B. Rout,  Nucl.  Instr.  Math.   B; 130, 219 (1997).

34.     MeV As and Au ion implantation in Si, GaP, GaAs, InSb and LiNbO3 : Study of range and lattice location;  G.Kuri, B.Sundaravel, B. Rout, D.P.Mahapatra and  B.N.Dev,  Nucl. Instr. Meth.  B 111, 234 (1996).

35.     Effect of MeV Au ion implantation on the  composition of GaAs upon vacuum annealing  PIXE and XRF studies;  G. Kuri, B. Rout, B. Sundaravel, D. P. Mahapatra  and B. N. Dev, Nucl. Instr. and Meth.  B 119, 403 (1996).

36.     Channeling studies on self-assembled Au4Si islands on Br-passivated Si(111)  surfaces;  B. Sundaravel , K. Sekar,  P. V. Satyam, G. Kuri, B. Rout, S. K. Ghose,  D. P. Mahapatra    and B. N. Dev,  Ind. J. Phys.  70A, 687 (1996).

37.     Determination of strain in a buried epitaxial CoSi2 layer in Si(111) by MeV ion scattering and  x-ray rocking curve methods, P. V. Satyam, B. Sundaravel, S. K. Ghose, B. Rout, K. Sekar, D. P. Mahapatra and B. N.   Dev, Indian J. Phys.  70A, (1996) 783.

38.     Thermal instability in Thin films: Self-assembling epitaxial island;  B. Sundaravel, P. V. Satyam, G. Kuri, B. Rout, S. K. Ghose, K. Sekar, D. P. Mahapatra and  B. N. Dev,  Thin Film Characterization and Applications, (Eds. Sa. K. Narayandass and D. Mangalraj, Allied Publishers, New Delhi, 1996) page. 256.

39.     Thin film characterization with grazing incidence X-ray  reflectometry;   P. V. Satyam, S. K. Ghose, B. Sundaravel, B. Rout, and B. N. Dev,  in Thin Film Characterization and Applications, (Eds. Sa. K. Narayandass and D. Mangalraj, Allied Publishers, New Delhi, 1996) page. 394.

40.     Characterization of ion beam synthesized epitaxial Si/CoSi2/Si(111) system with ion and x-ray scattering techniques;  P. V. Satyam, K. Sekar, G. Kuri, B. Sundaravel, S. K. Ghose, B. Rout, D. P. Mahapatra and B. N. Dev, Semiconductor devices, (Edited by K. Lal); Narosa Publishing House, New Delhi, 1996 Page 370-372.

41.     A high precision technique using x-ray reflectivity for the measurement of surface and interface roughness;  P. V. Satyam, D.Bahr, S. K. Ghose, G. Kuri, B. Sundaravel, B. Rout and B.  N. Dev,  Current Science, India  69, (1995) 526.

 

 

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